25.4 mm Measurement Reticle front product view on a dark background
Angled view of 25.4 mm Measurement Reticle for machine vision, microscopy and optical calibration

SO-RC01 SERIES

25.4 mm Measurement Reticle

SO-RC01 25.4 mm Measurement Reticle provides crosshair, scale and measurement patterns on a 25.4 mm substrate for microscopes and optical instruments.

$58.82
$58.82

Product Overview

Match 25.4 mm Measurement Reticle groove geometry to dispersion and efficiency

The listed geometry and pattern data should be evaluated with the complete optical system; groove, feature and calibration specifications cannot be inferred from outside dimensions alone.

Match the pattern and division value to system magnification, then verify line width and substrate thickness.

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Engineering Guidance

Choose groove geometry around dispersion and usable efficiency

Diffraction behavior

The listed geometry and pattern data should be evaluated with the complete optical system; groove, feature and calibration specifications cannot be inferred from outside dimensions alone.

Selection and system geometry

Match the pattern and division value to system magnification, then verify line width and substrate thickness.

Need a different diameter, tolerance or coating?

Custom substrate materials, dimensions, angular tolerances and coating bands can be reviewed for prototype and production quantities.

Request Engineering Review